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Semiconductor square resistivity detection probes/devices
Photovoltaic square resistance resistivity detection probe
Wafer heating plate, electrostatic chuck
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Home
About us
Products
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Semiconductor square resistivity detection probes/devices
Photovoltaic square resistance resistivity detection probe
Wafer heating plate, electrostatic chuck
News
Technical
Contact us
中文
|
English
Semiconductor probes
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Semiconductor probes
1
Semiconductor probes
Measurable semiconductor materials: Si (mono, poly), SiC, GaAs, GaN, InP
• SiC sheet can test thickness range: 130um-4mm
Support non-standard customization
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