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Semiconductor square resistivity detection probes/devices
Photovoltaic square resistance resistivity detection probe
Wafer heating plate, electrostatic chuck
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Home
About us
Products
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Semiconductor square resistivity detection probes/devices
Photovoltaic square resistance resistivity detection probe
Wafer heating plate, electrostatic chuck
News
Technical
Contact us
中文
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English
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Introduction to the basic principle of square resistance detection
2024-09-23
According to Faraday's law of electromagnetic induction, a changing current can produce a magnetic field,
Conductive film-conductive glass square resistivity on-line dynamic detection probe Mr. Zhou 13501965312
2024-09-23
The company was established by Harbin Institute of Technology master's degree, postdoctoral team and visiting scholars who have been engaged in the research and development and manufacturing of semiconductor testing equipment for decades.
Wafer heating plate, electrostatic chuck, semiconductor equipment special Mr. Zhou 13501965312
2024-09-23
The company relies on the R&D platform of the National Key Laboratory of Welding of Harbin .....
Crystal ingot-substrate-epitaxial wafer non-contact square resistance resistivity detection Mr. Zhou 13501965312
2024-09-23
"Ultra-thin and high-resistance detection", "Support non-standard customization, can provide a single probe for other equipment.....